On the NDT and E for the diagnosis of defects using infrared thermography

NDT and E International

Volumn 32, Issue 5, 1999, Pages 247-257

  Inagaki, Terumi ^a   Ishii, Toshimitsu ^b   Iwamoto, Toshikatsu ^a  

^a IBARAKI UNIVERSITY   (Japan)

^b JAPAN ATOMIC ENERGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

HEAT FLUX; HEAT TRANSFER COEFFICIENTS; REMOTE SENSING; TEMPERATURE; THERMAL CONDUCTIVITY; THERMOGRAPHY (IMAGING);

INFRARED THERMOGRAPHY; INVISIBLE DEFECTS;

NONDESTRUCTIVE EXAMINATION;

EID: 0032639716     PISSN: 09638695     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0963-8695(98)00059-0     Document Type: Article

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