Synapse classification and localization in Electron Micrographs

Pattern Recognition Letters

Volumn 43, Issue 1, 2014, Pages 17-24

  Jagadeesh, Vignesh ^a   Anderson, James ^b   Jones, Bryan ^b   Marc, Robert ^b   Fisher, Steven ^c   Manjunath, B S ^a  

^a University of California   (United States)

^b UNIVERSITY OF UTAH SCHOOL OF MEDICINE   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Connectomics; Detection; Electron Micrographs; Feature descriptors

Indexed keywords

ERROR DETECTION; PATTERN RECOGNITION; SOFTWARE ENGINEERING;

ANALYSIS PROBLEMS; BIOLOGICAL STRUCTURES; CONNECTOMICS; DETECTION AND LOCALIZATION; ELECTRON MICROGRAPH; FEATURE DESCRIPTORS; OBJECT DETECTION; SYNAPTIC JUNCTION;

MAMMALS;

EID: 84899455282     PISSN: 01678655     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.patrec.2013.06.001     Document Type: Article

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