Multiple structure tracing in 3D electron micrographs

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

Volumn 6891 LNCS, Issue PART 1, 2011, Pages 613-620

  Jagadeesh, Vignesh ^a   Vu, Nhat ^a   Manjunath, B S ^a  

^a University of California   (United States)

Author keywords

CRFs; Textures; Tracing

Indexed keywords

3D ELECTRON; CONDITIONAL RANDOM FIELD; CRFS; EDGE FEATURES; EDGE-BASED METHODS; HIGH CONFIDENCE; HIGHER ORDER; KEY FEATURE; MULTIPLE STRUCTURES; NEURONAL STRUCTURE; NEW MODEL; SEMI-SUPERVISED; TEM IMAGES; TRACING; TRACING PROCESS; TRANSMISSION ELECTRON MICROGRAPH;

COMPUTER AIDED ANALYSIS; ELECTROPHYSIOLOGY; MEDICAL COMPUTING; TEXTURES;

THREE DIMENSIONAL;

ALGORITHM; ARTICLE; COMPUTER ASSISTED DIAGNOSIS; COMPUTER SIMULATION; ELECTRON; ELECTRON MICROSCOPY; HUMAN; IMAGE PROCESSING; METHODOLOGY; NERVE CELL; PATHOLOGY; REPRODUCIBILITY; RETINA; STATISTICAL MODEL; THREE DIMENSIONAL IMAGING; TRANSMISSION ELECTRON MICROSCOPY; ULTRASTRUCTURE;

ALGORITHMS; COMPUTER SIMULATION; ELECTRONS; HUMANS; IMAGE INTERPRETATION, COMPUTER-ASSISTED; IMAGE PROCESSING, COMPUTER-ASSISTED; IMAGING, THREE-DIMENSIONAL; MICROSCOPY, ELECTRON; MICROSCOPY, ELECTRON, TRANSMISSION; MODELS, STATISTICAL; NEURONS; REPRODUCIBILITY OF RESULTS; RETINA;

EID: 80053548011     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/978-3-642-23623-5_77     Document Type: Conference Paper

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