Domain wall motion and electromechanical strain in lead-free piezoelectrics: Insight from the model system (1 - X)Ba(Zr0.2Ti 0.8)O3-x(Ba0.7Ca0.3)TiO3 using in situ high-energy X-ray diffraction during application of electric fields

Journal of Applied Physics

Volumn 115, Issue 14, 2014, Pages

  Tutuncu, Goknur ^a   Li, Binzhi ^b   Bowman, Keith ^c,d   Jones, Jacob L ^e  

^a J Crayton Pruitt Family Department of Biomedical Engineering   (United States)

^b University of California Davis   (United States)

^c Illinois Institute of Technology   (United States)

^d PURDUE UNIVERSITY   (United States)

^e North Carolina State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PIEZOELECTRICITY; TITANIUM OXIDES; X RAY DIFFRACTION;

ELECTRIC FIELD APPLICATIONS; ELECTROMECHANICAL STRAIN; HIGH ENERGY X-RAY DIFFRACTION; IN-SITU X-RAY DIFFRACTION; LEAD-FREE PIEZOELECTRICS; MORPHOTROPIC PHASE BOUNDARIES; PIEZOELECTRIC COEFFICIENT; TETRAGONAL DISTORTION;

DOMAIN WALLS;

EID: 84898934770     PISSN: 00218979     EISSN: 10897550     Source Type: Journal    
DOI: 10.1063/1.4870934     Document Type: Article

References (25)

1. J. Rodel, W. Jo, K. T. P. Seifert, E. M. Anton, T. Granzow, and D. Damjanovic, J. Am. Ceram. Soc. 92, 1153 (2009). 10.1111/j.1551-2916.2009.03061.x
2. D. Damjanovic, N. Klein, J. Li, and V. Porokhonsky, Funct. Mater. Lett. 3 (1), 5 (2010). 10.1142/S1793604710000919
3. J. Ravez, C. Broustera, and A. J. Simon, J. Mater. Chem. 9, 1609 (1999). 10.1039/a902335f
4. W. Liu and X. Ren, Phys. Rev. Lett. 103, 257602 (2009). 10.1103/PhysRevLett.103.257602
5. H. Bao, C. Zhou, D. Xue, J. Gao, and X. Ren, J. Phys. D 43, 465401 (2010). 10.1088/0022-3727/43/46/465401
6. B. Li, M. Ehmke, J. Blendell, and K. Bowman, J. Eur. Ceram. Soc. 33, 3037 (2013). 10.1016/j.jeurceramsoc.2013.05.032
7. M. C. Ehmke, N. H. Khansur, J. E. Daniels, J. E. Blendell, and K. J. Bowman, Acta Mater. 66, 340-348 (2014). 10.1016/j.actamat.2013.11.021
8. M. C. Ehmke, J. Glaum, M. Hoffman, J. E. Blendell, and K. J. Bowman, J. Am. Ceram. Soc. 96 (9), 2913 (2013). 10.1111/jace.12424
9. B. Li, J. E. Blendell, and K. Bowman, J. Am. Ceram. Soc. 94 (10), 3192 (2011). 10.1111/j.1551-2916.2011.04758.x
10. S. Su, R. Zuo, S. Lu, Z. Xu, X. Wang, and L. Li, Curr. Appl. Phys. 11, S120 (2011). 10.1016/j.cap.2011.01.034
11. J. Gao, D. Xue, Y. Wang, D. Wang, L. Zhang, H. Wu, S. Guo, H. Bao, C. Zhou, W. Liu, S. Hou, G. Xiao, and X. Ren, Appl. Phys. Lett. 99, 092901 (2011). 10.1063/1.3629784
12. X. Du, J. Zheng, U. Belegundu, and K. Uchino, Appl. Phys. Lett. 72, 2421 (1998). 10.1063/1.121373
13. G. Shirane, K. Suzuki, and A. Takeda, J. Phys. Soc. Jpn. 7, 12 (1952). 10.1143/JPSJ.7.12
14. A. Pramanick, D. Damjanovic, J. E. Daniels, J. Nino, and J. L. Jones, J. Am. Ceram. Soc. 94 (2), 293 (2011). 10.1111/j.1551-2916.2010.04240.x
15. T. Leist, K. G. Webber, W. Jo, W. Aulbach, J. Rodel, A. D. Prewitt, J. L. Jones, J. Schmidlin, and C. R. Hubbard, Acta Mater. 58, 5962 (2010). 10.1016/j.actamat.2010.07.012
16. T. Leist, T. Granzow, W. Jo, and J. Rodel, J. Appl. Phys. 108, 014103 (2010). 10.1063/1.3445771
17. J. Huber and N. A. Fleck, Eur. J. Mech., A: Solids 23, 203 (2004). 10.1016/j.euromechsol.2003.11.006
18. C. M. Landis, Curr. Opin. Solid State Mater. Sci. 8, 59 (2004). 10.1016/j.cossms.2004.03.010
19. G. Tutuncu, D. Damjanovic, J. Chen, and J. L. Jones, Phys. Rev. Lett. 108 (17), 177601 (2012). 10.1103/PhysRevLett.108.177601
20. A. P. Hammersley, Fit2D, version fit2d-12-077-i686-WXP, ESRF: Grenoble, 1987.
21. J. L. Jones, E. B. Slamovich, and K. J. Bowman, J. Appl. Phys. 97, 034113 (2005). 10.1063/1.1849821
22. J. E. Daniels, T. R. Finlayson, A. J. Studer, M. Hoffman, and J. L. Jones, J. Appl. Phys. 101, 094104 (2007). 10.1063/1.2720255
23. J. L. Jones, J. Electroceram. 19 (1), 69 (2007). 10.1007/s10832-007-9048- z
24. M. Marsilius, T. Granzow, and J. L. Jones, J. Mater. Res. 26 (9), 1126 (2011). 10.1557/jmr.2011.40
25. J. L. Jones, M. Hoffman, and K. J. Bowman, J. Appl. Phys. 98, 024115 (2005). 10.1063/1.1988978