In situ X-ray diffraction of biased ferroelastic switching in tetragonal lead-free (1-x) Ba (Zr 0.2 Ti 0.8) O 3-x(Ba 0.7 Ca 0.3) TiO 3 piezoelectrics

Journal of the American Ceramic Society

Volumn 96, Issue 9, 2013, Pages 2913-2920

  Ehmke, Matthias C ^a   Glaum, Julia ^b   Hoffman, Mark ^b   Blendell, John E ^a   Bowman, Keith J ^a,c  

^a PURDUE UNIVERSITY   (United States)

^b UNIVERSITY OF NEW SOUTH WALES   (Australia)

^c Illinois Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR SWITCHING; DOMAIN SWITCHINGS; FERROELASTIC DOMAINS; FERROELASTIC SWITCHING; INTERNAL BIAS FIELD; MACROSCOPIC STRAINS; PIEZOELECTRIC COEFFICIENT; SITU X-RAY DIFFRACTION;

ELECTRIC FIELDS; GRAIN BOUNDARIES; TEXTURES; X RAY DIFFRACTION;

SWITCHING;

EID: 84884287882     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/jace.12424     Document Type: Article

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