CMOS technology characterization for analog/RF application

Proceedings - 11th Workshop on Electronics for LHC and Future Experiments, LECC 2005

Volumn , Issue , 2005, Pages 33-41

  Seebacher, Ehrenfried ^a  

^a AMS AG   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; EXPERIMENTS; FIELD EFFECT TRANSISTORS; MONTE CARLO METHODS; SCATTERING PARAMETERS; TRANSISTORS;

ANALOG APPLICATIONS; BANDGAP REFERENCE; CHARGE-BASED MODELS; FREQUENCY DEPENDENT; MISMATCH PARAMETERS; S-PARAMETER MEASUREMENTS; STATISTICAL MODELING; TEMPERATURE MODELING;

MOS CAPACITORS;

EID: 84898844825     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)

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