Unified statistical modeling for circuit simulation

2002 International Conference on Modeling and Simulation of Microsystems - MSM 2002

Volumn , Issue , 2002, Pages 715-718

  McAndrew, Colin C ^a   Drennan, Patrick G ^a  

^a MOTOROLA INC   (United States)

Author keywords

Circuit simulation; SPICE modeling; Statistical modeling

Indexed keywords

CIRCUIT SIMULATION; ELECTRICAL BEHAVIOURS; ELECTRICAL TEST (ET); SPICE MODELING;

ALGORITHMS; COMPUTER SIMULATION; CORRELATION METHODS; DATA REDUCTION; EMBEDDED SYSTEMS; MATHEMATICAL MODELS; MONTE CARLO METHODS; PARAMETER ESTIMATION; STATISTICAL METHODS; THICKNESS MEASUREMENT;

INTEGRATED CIRCUITS;

EID: 6344231970     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. http://www-device.EECS.Berkeley.EDU/~bsim3/
2. P. G. Drennan and C. C. McAndrew, IEEE IEDM Tech. Digest, pp. 167-170, 1999.
3. W. F. Davis and R. T. Ida, Proc. IEEE BCTM, pp. 262-265, 1989.
4. J. A. Power et al., IEEE Trans. Semicond. Manufact., vol. 7, pp. 306-318, 1994.
5. J. B. Shyu, G. C. Temes, and K. Yao, IEEE J. Solid-State Circuits, vol. SC-17, no. 6, pp. 1070-1076, Dec. 1982.