Femtosecond resolution bunch profile measurements

EPAC 2006 - Contributions to the Proceedings

Volumn , Issue , 2006, Pages 915-919

  Jamison, S P ^a   Berden, G ^b   MacLeod, A M ^c   Steffen, B ^d   Phillips, P J ^e   Gillespie, W A ^e  

^a ASTeC   (United Kingdom)

^b FELIX Facility   (Netherlands)

^c UNIVERSITY OF ABERTAY DUNDEE   (United Kingdom)

^d DESY   (Germany)

^e UNIVERSITY OF DUNDEE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

LASER DIAGNOSTICS;

DEVELOPMENT AND OPERATIONS; ELECTRO-OPTIC DETECTION; FEMTO-SECOND RESOLUTION; MEASUREMENT TECHNIQUES; NON DESTRUCTIVE; PROFILE MEASUREMENT; REAL-TIME DIAGNOSTICS; TIME RESOLUTION;

ULTRAFAST LASERS;

EID: 84898835654     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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