A novel approach to measure grain boundary segregation in bulk polycrystalline materials in dependence of the boundaries' five rotational degrees of freedom

Scripta Materialia

Volumn 81, Issue , 2014, Pages 16-19

  Mandal, S ^a   Pradeep, K G ^a   Zaefferer, S ^a   Raabe, D ^a  

^a MAX PLANCK INSTITUT FÜR EISENFORSCHUNG GMBH   (Germany)

Author keywords

Atom probe tomography; Electron backscatter diffraction; Grain boundary crystallography; Segregation

Indexed keywords

DEGREES OF FREEDOM (MECHANICS); ELECTRON DIFFRACTION; GRAIN BOUNDARIES; MECHANICS; POLYCRYSTALLINE MATERIALS; TWO DIMENSIONAL;

ATOM PROBE TOMOGRAPHY; COMPOSITION ANALYSIS; ELECTRON BACK SCATTER DIFFRACTION; GRAIN BOUNDARY SEGREGATION; NON DESTRUCTIVE; ROTATIONAL DEGREES OF FREEDOM; SEGREGATION ANALYSIS; SITE-SPECIFIC;

SEGREGATION (METALLOGRAPHY);

EID: 84898776381     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2014.02.016     Document Type: Article

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