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Volumn 118, Issue 14, 2014, Pages 7698-7704

Statistical raman microscopy and atomic force microscopy on heterogeneous graphene obtained after reduction of graphene oxide

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON FILMS;

EID: 84898463739     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp500580g     Document Type: Article
Times cited : (97)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.