Visualization of defect densities in reduced graphene oxide

Carbon

Volumn 50, Issue 10, 2012, Pages 3666-3673

  Eigler, Siegfried ^a   Dotzer, Christoph ^a   Hirsch, Andreas ^a  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DEGREE OF FUNCTIONALIZATION; GRAPHENE OXIDES; LASER EXPOSURE; LOCAL DEFECTS; REDUCED GRAPHENE OXIDES;

DEFECTS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; VISUALIZATION;

DEFECT DENSITY;

EID: 84861608313     PISSN: 00086223     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.carbon.2012.03.039     Document Type: Article

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