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Volumn 21, Issue 1, 2014, Pages 262-272

Partial discharges in SF6 gas filled void under standard aperiodic and oscillating switching impulses

Author keywords

fault diagnosis; oscillating impulse; Partial discharge; void defects

Indexed keywords

ELECTRIC SWITCHGEAR; FAILURE ANALYSIS; FAULT DETECTION; SULFUR HEXAFLUORIDE;

EID: 84897704978     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDEI.2013.004093     Document Type: Article
Times cited : (9)

References (27)
  • 1
    • 0027683737 scopus 로고
    • Aging phenomenology and modeling
    • G. C. Montanari and L. Simoni, "Aging phenomenology and modeling", IEEE Trans. Electr. Insul., Vol. 28, No. 5, pp. 755-776, 1993.
    • (1993) IEEE Trans. Electr. Insul. , vol.28 , Issue.5 , pp. 755-776
    • Montanari, G.C.1    Simoni, L.2
  • 2
    • 0025495891 scopus 로고
    • Models for insulation aging under electrical and thermal multistress
    • P. Cygan and J. R. Laghari, "Models for insulation aging under electrical and thermal multistress", IEEE Trans. Electr. Insul., Vol. 25, No. 5, pp. 923-934, 1990.
    • (1990) IEEE Trans. Electr. Insul. , vol.25 , Issue.5 , pp. 923-934
    • Cygan, P.1    Laghari, J.R.2
  • 3
    • 0028408821 scopus 로고
    • Development of detection and diagnostic techniques for partial discharges in GIS
    • M. Oyama, E. Hanai, H. Aoyagi, H. Murase, I. Ohshima and S. Menju, "Development of detection and diagnostic techniques for partial discharges in GIS", IEEE Trans. Power Delivery, Vol. 9, No. 2, pp. 811-818, 1994.
    • (1994) IEEE Trans. Power Delivery , vol.9 , Issue.2 , pp. 811-818
    • Oyama, M.1    Hanai, E.2    Aoyagi, H.3    Murase, H.4    Ohshima, I.5    Menju, S.6
  • 5
    • 84857319844 scopus 로고    scopus 로고
    • Life tests on twisted pairs in presence of partial discharges: Influence of the voltage waveform
    • F. Guastavino and A. Dardano, "Life tests on twisted pairs in presence of partial discharges: Influence of the voltage waveform", IEEE Trans. Dielectr. Electr. Insul., Vol. 19, No. 1, pp. 45-52, 2012.
    • (2012) IEEE Trans. Dielectr. Electr. Insul. , vol.19 , Issue.1 , pp. 45-52
    • Guastavino, F.1    Dardano, A.2
  • 6
    • 84866898660 scopus 로고    scopus 로고
    • The influence of test waveforms on partial discharge activity in XLPE
    • A. Cavallini, G. C. Montanari and L. E. Mariut, "The influence of test waveforms on partial discharge activity in XLPE", IEEE Int'l. Sympos. Electr. Insul. pp. 554-557, 2012.
    • (2012) Int'L. Sympos. Electr. Insul. , pp. 554-557
    • Cavallini, A.1    Montanari, G.C.2    Mariut, L.E.3
  • 7
    • 77249095108 scopus 로고    scopus 로고
    • Influence of rise time on partial discharge extinction voltage at semi-square voltage waveforms
    • E. Lindell, T. Bengtsson, J. Blennow and S. M. Gubanski, "Influence of rise time on partial discharge extinction voltage at semi-square voltage waveforms", IEEE Trans. Electr. Insul., Vol. 17, No.1, pp. 141-148, 2010.
    • (2010) IEEE Trans. Electr. Insul. , vol.17 , Issue.1 , pp. 141-148
    • Lindell, E.1    Bengtsson, T.2    Blennow, J.3    Gubanski, S.M.4
  • 8
    • 0029386294 scopus 로고
    • Interpretation of partial discharge at dc voltages
    • U. Fromm, "Interpretation of partial discharge at dc voltages", IEEE Trans. Dielectr. Electr. Insul., Vol. 2, No. 5, pp. 761-770, 1995.
    • (1995) IEEE Trans. Dielectr. Electr. Insul. , vol.2 , Issue.5 , pp. 761-770
    • Fromm, U.1
  • 9
    • 77954190105 scopus 로고    scopus 로고
    • Investigation of partial discharge mechanisms in a void under AC electric stress
    • Australia
    • T. R. Blackburn, Z. Liu, B. T. Phung and R. Morrow, "Investigation of partial discharge mechanisms in a void under AC electric stress", 11th Int'l. Sympos. High Voltage Eng. (ISH), Vol. 4, Australia, pp. 364-368, 1999.
    • (1999) 11th int'L. Sympos. High Voltage Eng. (ISH) , vol.4 , pp. 364-368
    • Blackburn, T.R.1    Liu, Z.2    Phung, B.T.3    Morrow, R.4
  • 10
    • 0026173325 scopus 로고
    • Discussion: Partial discharges in ellipsoidal and spheroidal voids
    • DOI 10.1109/14.85127
    • M. G. Danikas, I. W. McAllister, G. C. Crichtion and A. Pedersen, "Discussion: partial discharges in ellipsoidal and spheroidal voids", IEEE Trans. Electr. Insul., Vol. 26, No. 3, pp. 537-539, 1991. (Pubitemid 21690722)
    • (1991) IEEE transactions on electrical insulation , vol.26 , Issue.3 , pp. 537-539
    • Danikas, M.G.1
  • 11
    • 80054085819 scopus 로고    scopus 로고
    • Study on the characteristics of partial discharges in voids under square voltage by detecting light emission intensity
    • Oct.
    • K. Wu, C. Pan, Y. P. Meng, C. H. Sun, M. G. Gao, K. Qin and H. Y. Long, "Study on the characteristics of partial discharges in voids under square voltage by detecting light emission intensity", IEEE Trans. Dielectr. Electr. Insul., Vol. 18, No. 5, pp. 1651-1657, Oct. 2011.
    • (2011) IEEE Trans. Dielectr. Electr. Insul. , vol.18 , Issue.5 , pp. 1651-1657
    • Wu, K.1    Pan, C.2    Meng, Y.P.3    Sun, C.H.4    Gao, M.G.5    Qin, K.6    Long, H.Y.7
  • 12
    • 79951672877 scopus 로고    scopus 로고
    • Characteristics and development mechanisms of partial discharge in SF6 gas under impulse voltages
    • X. F. Zhao, X. Yao, Z. F. Guo, J. H. Li, W. R. Si and Y. M. Li, "Characteristics and development mechanisms of partial discharge in SF6 gas under impulse voltages", IEEE Trans. Plasma. Sci., Vol. 39, No. 2, pp. 668-674, 2011.
    • (2011) IEEE Trans. Plasma. Sci. , vol.39 , Issue.2 , pp. 668-674
    • Zhao, X.F.1    Yao, X.2    Guo, Z.F.3    Li, J.H.4    Si, W.R.5    Li, Y.M.6
  • 16
    • 0037671712 scopus 로고
    • Conduction currents in gas insulated switchgear for low level dc-stress
    • N. Fujimoto, "Conduction currents in gas insulated switchgear for low level dc-stress", Vth Int'l. Sympos. Gaseous Dielectrics, Knoxville, pp. 513-519, 1987.
    • (1987) Vth int'L. Sympos. Gaseous Dielectrics, Knoxville , pp. 513-519
    • Fujimoto, N.1
  • 17
    • 0025386854 scopus 로고
    • 6 decomposition and oxidation in glow and corona discharges
    • DOI 10.1109/14.45235
    • R. J. Van Brunt and J. T. Herron, "Fundamental processes of SF6 decomposition and oxidation in glow and corona discharges," IEEE Trans. Electr. Insul., Vol. 25, No. 1, pp. 75-94, 1990. (Pubitemid 20688561)
    • (1990) IEEE transactions on electrical insulation , vol.25 , Issue.1 , pp. 75-94
    • Van Brunt, R.J.1    Herron, J.T.2
  • 18
    • 0000733562 scopus 로고
    • The Richardson constant for thermionic emission in Schottky barrier diodes
    • C. R. Crowell, "The Richardson constant for thermionic emission in Schottky barrier diodes", Solid-State Electronics, Vol. 8, No. 4, pp. 395-399, 1965.
    • (1965) Solid-State Electronics , vol.8 , Issue.4 , pp. 395-399
    • Crowell, C.R.1
  • 22
    • 0001241373 scopus 로고
    • Decay of charge deposited on the wall of a gaseous void
    • I. W. McAllister, "Decay of charge deposited on the wall of a gaseous void", IEEE Trans. Electr. Insul., Vol. 27, No. 6, pp. 1202-1207, 1992.
    • (1992) IEEE Trans. Electr. Insul. , vol.27 , Issue.6 , pp. 1202-1207
    • McAllister, I.W.1
  • 23
    • 0000900944 scopus 로고
    • The mechanism of the long spark formation
    • I. Gallimberiti, "The mechanism of the long spark formation," J.. de Physique, Vol. 40, No. 7, pp. 193-250, 1979.
    • (1979) J.. de Physique , vol.40 , Issue.7 , pp. 193-250
    • Gallimberiti, I.1
  • 25
    • 0029356842 scopus 로고
    • A generalized approach to partial discharge in modeling
    • L. Niemeyer, "A generalized approach to partial discharge in modeling", IEEE Trans. Dielectr. Electr. Insul., Vol. 2, No. 4, pp. 510-528, 1995.
    • (1995) IEEE Trans. Dielectr. Electr. Insul. , vol.2 , Issue.4 , pp. 510-528
    • Niemeyer, L.1
  • 27
    • 63749124800 scopus 로고    scopus 로고
    • A global model for SF6 plasmas coupling reaction kinetics in the gas phase and on the surface of the reactor walls
    • 15
    • G. Kokkoris, A. Panagiotopoulos, A. Goodyear, "A global model for SF6 plasmas coupling reaction kinetics in the gas phase and on the surface of the reactor walls", J. Phys. D: Appl. Phys., Vol. 42, No. 5, 055209, 15 pages, 2009.
    • (2009) J. Phys. D: Appl. Phys. , vol.42 , Issue.5 , pp. 055209
    • Kokkoris, G.1    Panagiotopoulos, A.2    Goodyear, A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.