Study on the characteristics of partial discharges in voids under square voltage by detecting light emission intensity

IEEE Transactions on Dielectrics and Electrical Insulation

Volumn 18, Issue 5, 2011, Pages 1651-1657

  Wu, Kai ^a   Pan, Cheng ^a   Meng, Yongpeng ^a   Sun, Changhao ^a   Gao, Minggang ^a   Qin, Kai ^a   Long, Hongyu ^a  

^a XI'AN JIAOTONG UNIVERSITY   (China)

Author keywords

degradation; light intensity; PD; square voltage; voltage rise rate

Indexed keywords

ABNORMAL PHENOMENON; DEGRADATION PROCESS; GOOD CORRELATIONS; LIGHT EMISSION INTENSITY; LIGHT INTENSITY; PARTIAL DISCHARGE BEHAVIORS; PD MEASUREMENTS; SQUARE VOLTAGE; SURFACE CONDITIONS; VOID SIZE; VOLTAGE RISE; VOLTAGE RISE RATE;

DEGRADATION; PARTIAL DISCHARGES;

LIGHT EMISSION;

EID: 80054085819     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDEI.2011.6032836     Document Type: Conference Paper

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