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Volumn 43, Issue 3, 2014, Pages 373-375

Development of a compact scanning transmission X-ray microscope (STXM) at the Photon Factory

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EID: 84897687825     PISSN: 03667022     EISSN: 13480715     Source Type: Journal    
DOI: 10.1246/cl.130948     Document Type: Article
Times cited : (16)

References (24)
  • 1
    • 34748847241 scopus 로고    scopus 로고
    • ed. by P. W. Hawkes, J. C. H. Spence, Springer, New York, Chap. 13. doi:10.1007/978-0-387-49762-4-13
    • M. Howells, C. Jacobsen, T. Warwick, A. Van den Bos, in Science of Microscopy, ed. by P. W. Hawkes, J. C. H. Spence, Springer, New York, 2007, Vol. 2, Chap. 13. doi:10.1007/978-0-387-49762-4-13.
    • (2007) Science of Microscopy , vol.2
    • Howells, M.1    Jacobsen, C.2    Warwick, T.3    Van Den Bos, A.4
  • 12
    • 84897680162 scopus 로고    scopus 로고
    • We used finite element analysis software Autodesk Simulation Mechanical. For details, see http://www.autodesk.com.
    • Autodesk Simulation Mechanical


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.