Interactive overlay maps for US patent (USPTO) data based on International Patent Classification (IPC)

Scientometrics

Volumn 98, Issue 3, 2014, Pages 1583-1599

  Leydesdorff, Loet ^a   Kushnir, Duncan ^b   Rafols, Ismael ^c,d  

^a UNIVERSITY OF AMSTERDAM   (Netherlands)

^b CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

^c UNIVERSITY OF SUSSEX   (United Kingdom)

^d INGENIO CSIC UPV Technical University of Valencia   (Spain)

Author keywords

Classification; IPC; Map; Overlay; Patent; USPTO

Indexed keywords

EID: 84897573545     PISSN: 01389130     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11192-012-0923-2     Document Type: Article

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