Error-term computation for the 15-term error-model preserving measurement dynamic

1998 28th European Microwave Conference, EuMC 1998

Volumn 1, Issue , 1998, Pages 253-258

  Gronefeld, A ^a   Schiek, B ^a  

^a RUHR UNIVERSITY BOCHUM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CALIBRATION;

CALIBRATION STANDARD; NOVEL ALGORITHM; ON-WAFER MEASUREMENTS; VECTOR NETWORK ANALYZERS;

CROSSTALK;

EID: 84897559595     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EUMA.1998.337996     Document Type: Conference Paper

References (7)

1. Butler, J. V. , Rytting, D. K. , Iskander, M. F. , Pollard, R. D. , and van den Bossche, M. , "16-Term Error Model and Calibration Procedure for On-Wafer Network Analysis Measurements", IEEE Transactions on Microwave Theory and Techniques, MTT-39, Dec. 1991, pp. 2211-2217
2. Gronefeld, A. , Schiek, B. , Network-Analyzer Self-Calibration with four or five Standards for the 15-Term Error- Model", Proceedings of the IEEE MTT-S International Microwave Symposium, Denver, pp. 1655-1658, 1997
3. Heuermann, H., Schiek, B., "Results of Network Analyzer Measurements with Leakage Errors Corrected with the TMS-15-Term Procedure, " Proceedings of the IEEE MTT-S International Microwave Symposium, San Diego 1994, pp. 1361-1364
4. Heuermann, H., Schiek, B., "Results of Network Analyzer Measurements with Leakage Errors Corrected with the TMS-15-Term Procedure, " Proceedings of the IEEE MTT-S International Microwave Symposium, San Diego 1994, pp. 1361-1364
5. Pfost, M., Rein, H. -M., "Modeling and Measurement of Substrate Coupling in Si-Bipolar IC's up to 40GHz", IEEE Journal of Solid-State Circuits, Vol. 33, No. 4, April 1998, pp. 582-591
6. Speciale, RA., "A Generalization of the TSD Network-Analyzer Calibration Procedure, Covering n-Port Scattering-Parameter Measurements, Affected by Leakage Errors", IEEE Transactions on Microwave Theory and Techniques, MTT-25, Dec. 1977, pp. 1100-1115
7. Van Hamme, H., Vanden Bosche, M., "Flexible Vector Network Analyzer Calibration With Accuracy Bounds Using an 8-Term or a 16-Term Error Correction Model", IEEE Transactions on Microwave Theory and Techniques, MTT-42, pp. 976-987