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Volumn 105, Issue 5, 2014, Pages

Measure of Diracness in two-dimensional semiconductors

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EID: 84897444681     PISSN: 02955075     EISSN: 12864854     Source Type: Journal    
DOI: 10.1209/0295-5075/105/57005     Document Type: Article
Times cited : (39)

References (31)
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    • 3442881546 scopus 로고
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    • Semenoff G. W. 1984 Phys. Rev. Lett. 53 2449
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    • Semenoff, G.W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.