Raman scattering crystalline assessment of polycrystalline Cu 2ZnSnS4 thin films for sustainable photovoltaic technologies: Phonon confinement model

Acta Materialia

Volumn 70, Issue , 2014, Pages 272-280

  Dimitrievska, M ^a   Fairbrother, A ^a   Perez Rodriguez A ^a,b   Saucedo, E ^a   Izquierdo Roca, V ^a  

^a CATALONIA INSTITUTE FOR ENERGY RESEARCH IREC   (Spain)

^b UNIVERSITY OF BARCELONA   (Spain)

Author keywords

Defects; Kesterite; Lattice strains; Nanoconfinement; Raman spectroscopy

Indexed keywords

CRYSTALLINE MATERIALS; DEFECTS; FREQUENCY ESTIMATION; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; THIN FILMS; X RAY DIFFRACTION;

KESTERITES; LATTICE STRAIN; NANOCONFINEMENTS; PHONON CONFINEMENT EFFECT; PHONON CONFINEMENT MODEL; PHOTOVOLTAIC TECHNOLOGY; QUANTITATIVE INDICATORS; RAMAN SCATTERING SPECTRA;

PHONONS;

EID: 84897412041     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2014.02.035     Document Type: Article

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