AFM-based model of percolation in graphene-based polymer nanocomposites

Composites Science and Technology

Volumn 95, Issue , 2014, Pages 38-43

  Syurik, Julia ^a   Alyabyeva, Natalya ^b   Alekseev, Alexander ^c   Ageev, Oleg A ^b  

^a KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^b SOUTHERN FEDERAL UNIVERSITY   (Russian Federation)

^c UNIVERSITY OF GLASGOW   (United Kingdom)

Author keywords

Atomic force microscopy (AFM); Electrical properties; Modeling; Nanocomposites; Scanning electron microscopy (SEM)

Indexed keywords

CONDUCTIVE ATOMIC FORCE MICROSCOPY; CONDUCTIVITY MEASUREMENTS; FITTING PARAMETERS; GRAPHENE NANOPLATELETS; PERCOLATION MODELS; PERCOLATION THRESHOLDS; POLYMER NANOCOMPOSITE;

ATOMIC FORCE MICROSCOPY; ELECTRIC PROPERTIES; FORECASTING; GRAPHENE; MODELS; PERCOLATION (COMPUTER STORAGE); PERCOLATION (FLUIDS); SCANNING ELECTRON MICROSCOPY; SOLVENTS;

NANOCOMPOSITES;

EID: 84896887323     PISSN: 02663538     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.compscitech.2014.02.006     Document Type: Article

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