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Volumn 25, Issue 13, 2014, Pages

The role of surface and deep-level defects on the emission of tin oxide quantum dots

Author keywords

blue emission; surface defect and deeplevel defect

Indexed keywords

COMBUSTION; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; OXIDE MINERALS; PHOTOELECTRONS; SEMICONDUCTOR QUANTUM DOTS; TIN; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84896803312     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/25/13/135701     Document Type: Article
Times cited : (132)

References (41)
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    • 10644286724 scopus 로고    scopus 로고
    • 10.1016/S0040-6090(02)00288-2 0040-6090
    • Jiang J C 2002 Thin Solid Films 411 203
    • (2002) Thin Solid Films , vol.411 , pp. 203
    • Jiang, J.C.1
  • 6
    • 33645149921 scopus 로고    scopus 로고
    • 10.1016/j.matlet.2005.12.003
    • Wang S 2006 Mater. Lett. 60 1706
    • (2006) Mater. Lett. , vol.60 , pp. 1706
    • Wang, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.