Indirect measurement of thermal conductivity in silicon nanowires

Journal of Applied Physics

Volumn 115, Issue 8, 2014, Pages

  Pennelli, Giovanni ^a   Nannini, Andrea ^a   Macucci, Massimo ^a  

^a UNIVERSITY OF PISA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

NANOWIRES; SILICON;

ACCURATE MEASUREMENT; CONTACT THERMAL RESISTANCE; INDIRECT MEASUREMENTS; JOULE SELF-HEATING; MEASUREMENT TECHNIQUES; REDUCTION OF THERMAL CONDUCTIVITY; SILICON NANO STRUCTURES; THERMAL CONDUCTIVITY MEASUREMENTS;

THERMAL CONDUCTIVITY;

EID: 84896751419     PISSN: 00218979     EISSN: 10897550     Source Type: Journal    
DOI: 10.1063/1.4866994     Document Type: Article

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