Advanced Bayesian estimation of Weibull early life failure distributions

Quality and Reliability Engineering International

Volumn 30, Issue 3, 2014, Pages 363-373

  Kurz, Daniel ^a   Lewitschnig, Horst ^b   Pilz, Jürgen ^a  

^a UNIVERSITY OF KLAGENFURT   (Austria)

^b INFINEON TECHNOLOGIES AUSTRIA AG   (Austria)

Author keywords

Bayes; burn in; Dirichlet distribution; semiconductor reliability; Weibull distribution

Indexed keywords

BAYESIAN NETWORKS; DATA HANDLING; FAILURE ANALYSIS; MONTE CARLO METHODS; SEMICONDUCTOR DEVICE MANUFACTURE; STATISTICS;

BAYES; BAYESIAN ESTIMATION MODEL; BURN-IN; DECREASING FAILURE RATE; DIRICHLET DISTRIBUTIONS; DIRICHLET PRIOR DISTRIBUTION; POSTERIOR DISTRIBUTIONS; SEMICONDUCTOR MANUFACTURING;

WEIBULL DISTRIBUTION;

EID: 84896401028     PISSN: 07488017     EISSN: 10991638     Source Type: Journal    
DOI: 10.1002/qre.1577     Document Type: Conference Paper

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