Corrigendum to “Structural and optical properties of high refractive indices lead vanadate thin films” [Mater. Chem. Phys. 144(2014) 433-439](S025405841400025X)(10.1016/j.matchemphys.2014.01.016);Structural and optical properties of high refractive indices lead vanadate thin films

Materials Chemistry and Physics

Volumn 144, Issue 3, 2014, Pages 433-439

  Saddeek, Y B ^a   Aly, K A ^a,b  

^a Al Azhar University   (Egypt)

^b KING ABDULAZIZ UNIVERSITY   (Saudi Arabia)

Author keywords

A. Oxides; A. Thin films; B. Vacuum deposition; C. Fourier transform infrared spectroscopy (FTIR); D. Dielectric properties; D. Optical properties

Indexed keywords

DEPOSITION; DIELECTRIC PROPERTIES OF SOLIDS; ENERGY GAP; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GLASS; LEAD OXIDE; RED SHIFT; REFRACTIVE INDEX; THERMAL EVAPORATION; TUNGSTEN COMPOUNDS; VANADIUM PENTOXIDE;

COMPLEX INDEX OF REFRACTION; HIGH REFRACTIVE INDEX; MELT QUENCHING TECHNIQUES; NONLINEAR OPTICAL DEVICES; NONLINEAR OPTICAL SUSCEPTIBILITIES; SINGLE-OSCILLATOR MODEL; STRUCTURAL AND OPTICAL PROPERTIES; THERMAL EVAPORATION TECHNIQUE;

THIN FILMS;

EID: 84894576271     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2019.121800     Document Type: Erratum

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