Reliability, failure, and fundamental limits of graphene and carbon nanotube interconnects

Technical Digest - International Electron Devices Meeting, IEDM

Volumn , Issue , 2013, Pages

  Liao, Albert D ^a,c   Behnam, Ashkan ^a   Dorgan, Vincent E ^a   Li, Zuanyi ^b   Pop, Eric ^a,d  

^a Dept of Electrical and Computer Engineering ^*  (United States)

^b University of Illinois at Urbana Champaign   (United States)

^c MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^d STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84894339582     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEDM.2013.6724633     Document Type: Conference Paper

References (16)

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