Effects of annealing on nanocrystalline Bi2S3 thin films prepared by chemical bath deposition

Materials Science in Semiconductor Processing

Volumn 21, Issue 1, 2014, Pages 74-81

  Hussain, Amir ^a   Begum, Anayara ^a   Rahman, Atowar ^a  

^a GAUHATI UNIVERSITY   (India)

Author keywords

Nanocrystalline; SEM; Semiconductor; Thin film; XRD

Indexed keywords

CHEMICAL-BATH DEPOSITION; ELECTRICAL CONDUCTIVITY; NANOCRYSTALLINES; OPTICAL AND ELECTRICAL PROPERTIES; ORTHORHOMBIC STRUCTURES; SCANNING ELECTRON MICROSCOPY IMAGE; X-RAY DIFFRACTION STUDIES; XRD;

AGGLOMERATION; ANNEALING; CHLORINE COMPOUNDS; CRYSTALLITES; DEPOSITION; ELECTRIC PROPERTIES; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR MATERIALS; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION;

FILM PREPARATION;

EID: 84893852308     PISSN: 13698001     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mssp.2014.01.029     Document Type: Article

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