Window-based susceptance models for large-scale RLC circuit analyses

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2002, Pages 628-633

  Zheng, Hui ^a   Krauter, Byron ^b   Beattie, Michael ^a   Pileggi, Lawrence ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

^b IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUITS AND SYSTEMS; DESIGN VERIFICATION; MODEL AND SIMULATION; OPERATING FREQUENCY; SIMULATION EFFICIENCY; SIMULATION METHODOLOGY; SYMMETRIC POSITIVE DEFINITE; TRADITIONAL SIMULATORS;

CIRCUIT RESONANCE; COMPUTER SIMULATION; DESIGN; EXHIBITIONS; EXTRACTION; INDUCTANCE; MAGNETIC COUPLINGS; MATRIX ALGEBRA;

INDUSTRIAL APPLICATIONS;

EID: 84893746927     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2002.998366     Document Type: Conference Paper

References (12)

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