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Volumn , Issue , 2001, Pages 502-505

Comparison of CMOS VCOs for UMTS tuned by standard and novel varactors in standard 0.25μ m technology

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER FREQUENCY; CMOS TECHNOLOGY; FIGURE OF MERITS; FREQUENCY TUNING RANGE; FULLY INTEGRATED; M-TECHNOLOGIES; NOVEL DEVICES; TUNING ELEMENTS;

EID: 84893707542     PISSN: 19308833     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (3)

References (6)
  • 1
  • 2
    • 84938174380 scopus 로고
    • A simple model of feedback oscillator noise spectrum
    • Feb.
    • D.B. Leeson, "A simple model of feedback oscillator noise spectrum", Proc. IEEE, Feb. 1966, pp.
    • (1966) Proc. IEEE
    • Leeson, D.B.1
  • 3
    • 0031146007 scopus 로고    scopus 로고
    • A 1.8-GHz low-phase-noise CMOS VCO using optimized hollow spiral inductors
    • May
    • J. Craninkx, M. Steayert, "A 1.8-GHz Low-Phase-Noise CMOS VCO Using Optimized Hollow Spiral Inductors", Journal of Solid State Circuits, Vol. 32, No. 5 , May 1997, pp.736-744.
    • (1997) Journal of Solid State Circuits , vol.32 , Issue.5 , pp. 736-744
    • Craninkx, J.1    Steayert, M.2
  • 4
    • 0035391650 scopus 로고    scopus 로고
    • Low power, low phasenoise, differentially tuned quadrature VCO-Design in standard CMOS
    • July to be published
    • M. Tiebout, "Low power, low phasenoise, differentially tuned quadrature VCO-Design in standard CMOS", IEEE Journal of Solid State Circuits, Vol. 36, No. 7, July 2001, to be published.
    • (2001) IEEE Journal of Solid State Circuits , vol.36 , Issue.7
    • Tiebout, M.1
  • 5
    • 0033873406 scopus 로고    scopus 로고
    • A three terminal varactor for RF IC's in standard CMOS technology
    • April
    • F. Svelto, S. Manzini and R. Castello, "A Three Terminal Varactor for RF IC's in Standard CMOS Technology ", IEEE Transactions on Electron Devices, Vol. 47, No. 4, April 2000, pp. 893-895.
    • (2000) IEEE Transactions on Electron Devices , vol.47 , Issue.4 , pp. 893-895
    • Svelto, F.1    Manzini, S.2    Castello, R.3
  • 6
    • 0032139494 scopus 로고    scopus 로고
    • Estimation methods for quality factors of inductors fabricated in silicon integrated circuit process technologies
    • Aug.
    • Kenneth O, "Estimation Methods for Quality Factors of Inductors Fabricated in Silicon Integrated Circuit Process Technologies ", IEEE Journal of Solid State Circuits, Vol. 33, No. 8, Aug. 1998, pp. 1249-1252.
    • (1998) IEEE Journal of Solid State Circuits , vol.33 , Issue.8 , pp. 1249-1252
    • Kenneth, O.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.