Wavefront technology mapping

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 1999, Pages 531-536

  Stok, Leon ^a   Iyer, Mahesh A ^b   Sullivan, Andrew J ^c  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b SYNOPSYS INC   (United States)

^c IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONVENTIONAL MAPPING; DELAY MODELING; DIRECTED ACYCLIC GRAPHS; DYNAMIC DECOMPOSITION; EFFICIENT IMPLEMENTATION; TECHNOLOGY MAPPING; TECHNOLOGY MAPPING ALGORITHMS; WAVEFRONT ALGORITHMS;

CONFORMAL MAPPING; EXHIBITIONS; OPTIMIZATION; PATTERN MATCHING;

WAVEFRONTS;

EID: 84893635702     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.1999.761178     Document Type: Conference Paper

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