Novel failure prognostics approach with dynamic thresholds for machine degradation

IECON Proceedings (Industrial Electronics Conference)

Volumn , Issue , 2013, Pages 4404-4409

  Javed, Kamran ^a   Gouriveau, Rafael ^a   Zerhouni, Noureddine ^a  

^a FEMTO ST INSTITUTE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DATA PREPROCESSING; DEGRADING BEHAVIOR; DYNAMIC THRESHOLD; EXTREME LEARNING MACHINE; FAILURE PROGNOSTICS; FAILURE THRESHOLDS; REMAINING USEFUL LIVES; RUL ESTIMATIONS;

ESTIMATION; INDUSTRIAL ELECTRONICS; MACHINERY;

SYSTEMS ENGINEERING;

EID: 84893551138     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IECON.2013.6699844     Document Type: Conference Paper

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