Modeling approaches for prognostics and health management of electronics

International Journal of Performability Engineering

Volumn 6, Issue 5, 2010, Pages 467-476

  Kumar, Sachin ^a,b   Pecht, Michael ^a,c  

^a UNIVERSITY OF MARYLAND   (United States)

^b The DEI Group   (United States)

^c CITY UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

Data driven; Diagnostics; Electronics; Health monitoring; Physicsof failure (PoF); Prognostics

Indexed keywords

EID: 78651362840     PISSN: 09731318     EISSN: 29938341     Source Type: Journal    
DOI: None     Document Type: Article

References (22)

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