Precise parameter extraction technique for organic thin-film transistors operating in the linear regime

Journal of Applied Physics

Volumn 115, Issue 3, 2014, Pages

  Marinov, Ognian ^a   Jamal Deen, M ^a   Feng, Cong ^a   Wu, Yiliang ^a,b  

^a MCMASTER UNIVERSITY   (Canada)

^b XEROX RESEARCH CENTRE OF CANADA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EXTRACTION; FUNCTIONS; PARAMETER EXTRACTION; THIN FILM CIRCUITS; THIN FILMS; THRESHOLD VOLTAGE;

EXTRACTION TECHNIQUES; IV CHARACTERISTICS; LINEARLY PROPORTIONAL; MATHEMATICAL FUNCTIONS; MOBILITY ENHANCEMENT; ORGANIC THIN FILM TRANSISTOR (OTFTS); ORGANIC THIN FILM TRANSISTORS; RESISTANCE MODELING;

THIN FILM TRANSISTORS;

EID: 84893255246     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4862043     Document Type: Article

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