The impact of small world on patent productivity in China

Scientometrics

Volumn 98, Issue 2, 2014, Pages 945-960

  Zhang, Gupeng ^a   Guan, Jiancheng ^a   Liu, Xielin ^a  

^a UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

Author keywords

Clustering coefficient; Patent; Path length; Small world

Indexed keywords

EID: 84892844119     PISSN: 01389130     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11192-013-1142-1     Document Type: Article

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