Structural, morphological and optical properties of In2 S 3 thin films obtained by SILAR method

Optical and Quantum Electronics

Volumn 46, Issue 1, 2014, Pages 247-257

  Sall, T ^a   Raidou, A ^a   Elfarrass, S ^b   Hartiti, B ^b   Mari, B ^c   Qachaou, A ^a   Fahoume, M ^a  

^a IBN TOFAIL UNIVERSITY   (Morocco)

^b HASSAN II UNIVERSITY OF CASABLANCA   (Morocco)

^c UNIVERSITAT POLITÈCNICA DE VALÈNCIA   (Spain)

Author keywords

In2 S3; Photovoltaic; SILAR method; Thin films

Indexed keywords

ENERGY DISPERSIVE XRAY ANALYSES (EDAX); MORPHOLOGICAL STRUCTURES; MORPHOLOGY AND STRUCTURES; PHOTOVOLTAIC; POLYCRYSTALLINE THIN FILM; SILAR METHOD; X-RAY DIFFRACTION TECHNIQUES; X-RAYS DIFFRACTION;

ENERGY CONVERSION; ENERGY GAP; OPTICAL PROPERTIES; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; X RAY DIFFRACTION;

THIN FILMS;

EID: 84892784921     PISSN: 03068919     EISSN: 1572817X     Source Type: Journal    
DOI: 10.1007/s11082-013-9786-x     Document Type: Article

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