Synthesis, structural and transport properties of NaxV 2O5×nH2O xerogel nanocrystalline thin films

Journal of Alloys and Compounds

Volumn 590, Issue , 2014, Pages 572-578

  El Desoky, M M ^a   Al Assiri, M S ^b   Bahgat, A A ^c  

^a SUEZ UNIVERSITY   (Egypt)

^b NAJRAN UNIVERSITY   (Saudi Arabia)

^c Al Azhar University   (Egypt)

Author keywords

Electrical conductivity; Nanocrystalline thin films; Scanning electron microscopy; X ray diffraction; Xerogel

Indexed keywords

ELECTRICAL CONDUCTIVITY; ELECTROLYTIC SOLUTION; N-TYPE SEMICONDUCTORS; NANOCRYSTALLINE THIN FILMS; NANOCRYSTALLINES; NON-ADIABATIC; SMALL POLARON HOPPING; SOL-GEL TECHNIQUE;

ACTIVATION ENERGY; ELECTRIC CONDUCTIVITY; SCANNING ELECTRON MICROSCOPY; SOL-GELS; THERMOELECTRIC POWER; THIN FILMS; TRANSPORT PROPERTIES; X RAY DIFFRACTION;

XEROGELS;

EID: 84892637418     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2013.12.168     Document Type: Article

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