Structural properties of KxV2O5.nH 2O nanocrystalline films

Solid State Sciences

Volumn 13, Issue 3, 2011, Pages 590-595

  Negm, Samia E ^a   Mady, H A ^a   Moghny, A S Abdel ^a   Abd Rabo, A S ^a   Bahgat, A A ^a  

^a Al Azhar University   (Egypt)

Author keywords

AFM; DTA; FTIR; Sol gel; TEM; XRD

Indexed keywords

AFM; DTA; FTIR; TEM; XRD;

ATOMIC SPECTROSCOPY; DIFFERENTIAL SCANNING CALORIMETRY; FOURIER TRANSFORMS; GELS; SOL-GELS; SOLS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

SOL-GEL PROCESS;

EID: 79952040235     PISSN: 12932558     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solidstatesciences.2010.12.031     Document Type: Article

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