Spectroscopic study of nanocrystalline V2O5·nH2O films doped with Li ions

Optics and Laser Technology

Volumn 42, Issue 6, 2010, Pages 994-1003

  Al Assiri, M S ^a   El Desoky, M M ^a,b   Alyamani, A ^c   Al Hajry, A ^a   Al Mogeeth, A ^a   Bahgat, A A ^a,d  

^a KING KHALID UNIVERSITY   (Saudi Arabia)

^b Suez Canal University   (Egypt)

^c National Center for Mathematics and Physics   (Saudi Arabia)

^d Al Azhar University   (Egypt)

Author keywords

Nanocrystalline films; Refractive index; Vanadium pentoxide

Indexed keywords

ABSORPTION COEFFICIENTS; BAND TAIL; DIELECTRIC FUNCTIONS; DOUBLE-BEAM; EXTINCTION COEFFICIENTS; FORBIDDEN TRANSITIONS; HIGH ENERGY; HIGH PURITY; LOCALIZED STATE; LOW-ENERGY BAND; NANOCRYSTALLINE FILMS; NANOCRYSTALLINES; OPTICAL ABSORPTION COEFFICIENTS; OPTICAL GAP; OPTICAL MEASUREMENT; OPTICAL SPECTRA; REAL PART; SOL-GEL TECHNIQUE; SPECTROSCOPIC STUDIES; VANADIUM PENTOXIDE;

ABSORPTION; CARRIER CONCENTRATION; FILM PREPARATION; LIGHT REFRACTION; OPTICAL CONSTANTS; OPTICAL DATA PROCESSING; REFRACTIVE INDEX; REFRACTOMETERS; SPECTROSCOPIC ANALYSIS; VANADIUM; VANADIUM ALLOYS; VANADIUM COMPOUNDS;

OPTICAL FILMS;

EID: 77249140462     PISSN: 00303992     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optlastec.2010.01.020     Document Type: Article

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