메뉴 건너뛰기




Volumn 115, Issue 1, 2014, Pages

Contrasting the experimental properties of hydrogen in SnO2, In2O3, and TiO2

Author keywords

[No Author keywords available]

Indexed keywords

BROAD ABSORPTIONS; DONOR ELECTRONS; EPR EXPERIMENTS; N-TYPE CONDUCTIVITY; SHARP CONTRAST; STRETCHING LINE; TEMPERATURE DEPENDENCE; TRANSPARENT CONDUCTING OXIDE;

EID: 84892173334     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4837955     Document Type: Conference Paper
Times cited : (22)

References (42)
  • 2
    • 0030706222 scopus 로고    scopus 로고
    • 10.1038/39999
    • G. Thomas, Nature 389, 907 (1997). 10.1038/39999
    • (1997) Nature , vol.389 , pp. 907
    • Thomas, G.1
  • 4
    • 0042424320 scopus 로고
    • in, edited by F. Seitz and D. Turnbull (Academic Press, New York), Vol
    • G. Heiland, E. Mollwo, and F. Stöckman, in Solid State Physics, edited by, F. Seitz, and, D. Turnbull, (Academic Press, New York, 1959), Vol. 8, p. 193.
    • (1959) Solid State Physics , vol.8 , pp. 193
    • Heiland, G.1    Mollwo, E.2    Stöckman, F.3
  • 6
    • 18244430368 scopus 로고    scopus 로고
    • 10.1103/PhysRevLett.85.1012
    • C. G. Van de Walle, Phys. Rev. Lett. 85, 1012 (2000). 10.1103/PhysRevLett.85.1012
    • (2000) Phys. Rev. Lett. , vol.85 , pp. 1012
    • Van De Walle, C.G.1
  • 27
    • 0000094431 scopus 로고
    • the references contained therein. 10.1103/PhysRevB.16.3713
    • J. B. Bates and R. A. Perkins, Phys. Rev. B 16, 3713 (1977), and the references contained therein. 10.1103/PhysRevB.16.3713
    • (1977) Phys. Rev. B , vol.16 , pp. 3713
    • Bates, J.B.1    Perkins, R.A.2
  • 29
    • 77954829533 scopus 로고    scopus 로고
    • 10.1103/PhysRevB.81.035204
    • S. Yang and L. E. Halliburton, Phys. Rev. B 81, 035204 (2010). 10.1103/PhysRevB.81.035204
    • (2010) Phys. Rev. B , vol.81 , pp. 035204
    • Yang, S.1    Halliburton, L.E.2
  • 37
    • 0001707121 scopus 로고
    • 10.1016/0022-0248(76)90040-3
    • B. Thiel and R. Helbig, J. Cryst. Growth 32, 259 (1976). 10.1016/0022-0248(76)90040-3
    • (1976) J. Cryst. Growth , vol.32 , pp. 259
    • Thiel, B.1    Helbig, R.2
  • 40
    • 84892150825 scopus 로고    scopus 로고
    • in Proceedings of the International Conference on Defects in Semiconductors
    • W. B. Fowler, M. Stavola, and F. Bekisli, in Proceedings of the International Conference on Defects in Semiconductors (2013).
    • (2013)
    • Fowler, W.B.1    Stavola, M.2    Bekisli, F.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.