Topological aspects of charge-carrier transmission across grain boundaries in graphene

Nano Letters

Volumn 14, Issue 1, 2014, Pages 250-254

  Gargiulo, Fernando ^a   Yazyev, Oleg V ^a  

^a EPFL   (Switzerland)

Author keywords

dislocations; electronic transport; grain boundaries; Polycrystalline graphene; tight binding model; topological defects

Indexed keywords

DENSITY OF DISLOCATION; ELECTRONIC TRANSPORT; GRAIN-BOUNDARY DEFECTS; POLYCRYSTALLINE GRAPHENE; POLYCRYSTALLINE SAMPLES; TIGHT BINDING MODEL; TIGHT-BINDING APPROXIMATIONS; TOPOLOGICAL DEFECT;

BURGERS VECTOR; CHEMICAL VAPOR DEPOSITION; DEFECTS; DISLOCATIONS (CRYSTALS); GRAIN BOUNDARIES; GRAPHENE;

TOPOLOGY;

EID: 84892167816     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl403852a     Document Type: Article

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