Mechanism of polarization fatigue in BiFeO3: The role of Schottky barrier

Applied Physics Letters

Volumn 104, Issue 1, 2014, Pages

  Zhou, Yang ^a   Zou, Xi ^a   You, Lu ^a   Guo, Rui ^a   Shiuh Lim, Zhi ^a   Chen, Lang ^a   Yuan, Guoliang ^b   Wang, Junling ^a  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^b NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DOMAIN EVOLUTION; FATIGUE PROPERTIES; LOW WORK FUNCTION; OXIDE ELECTRODES; PIEZOELECTRIC FORCE MICROSCOPY; POLARIZATION FATIGUE; SCANNING KELVIN PROBE MICROSCOPY; SCHOTTKY BARRIERS;

ELECTRODES; ELECTROLYTIC CAPACITORS; INTERFACES (MATERIALS); POLARIZATION;

SCHOTTKY BARRIER DIODES;

EID: 84892149518     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4861231     Document Type: Article

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