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Volumn 92, Issue 2, 2008, Pages

Fatigue mechanism of the ferroelectric perovskite thin films

(11) Yang, Feng c Tang, M H a Zhou, Y C c Liu, Fen c Ma, Y c Zheng, X J c Tang, J X c Xu, H Y c Zhao, W F c Sun, Z H c He, J b

a XIANGTAN UNIVERSITY (China)

b Geological Survey of Canada Sidney (Canada)

c Geological Survey of Canada ^*

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PROPERTIES; FATIGUE CRACK PROPAGATION; FERROELECTRIC MATERIALS; THIN FILMS;

FATIGUE MECHANISM; LOCAL PHASE DECOMPOSITION MODELS; REMNANT POLARIZATION; VACANCY ELECTROMIGRATION THEORY;

PEROVSKITE;

EID: 38349162854 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.2835459 Document Type: Article

Times cited : (18)

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