RISING beamline (BL28XU) for rechargeable battery analysis

Journal of Synchrotron Radiation

Volumn 21, Issue 1, 2014, Pages 268-272

  Tanida, H ^a   Fukuda, K ^a   Murayama, H ^a   Orikasa, Y ^a   Arai, H ^a   Uchimoto, Y ^a   Matsubara, E ^a   Uruga, T ^b   Takeshita, K ^b,c   Takahashi, S ^b,c   Sano, M ^b   Aoyagi, H ^b   Watanabe, A ^b   Nariyama, N ^b,c   Ohashi, H ^b,c   Yumoto, H ^b   Koyama, T ^b   Senba, Y ^b   Takeuchi, T ^b   Furukawa, Y ^b,c   Ohata, T ^b,c   Matsushita, T ^b,c   Ishizawa, Y ^b   Kudo, T ^b,c   Kimura, H ^b,c   Yamazaki, H ^b   Tanaka, T ^b,c   Bizen, T ^b,c   Seike, T ^b,c   Goto, S ^b,c   Ohno, H ^b   Takata, M ^b,c   Kitamura, H ^b,c   Ishikawa, T ^b,c   Ohta, T ^d   Ogumi, Z ^a   more..

^a KYOTO UNIVERSITY   (Japan)

^b JASRI/SPring 8 ^*  (Japan)

^c RIKEN   (Japan)

^d RITSUMEIKAN UNIVERSITY   (Japan)

Author keywords

in situ analysis; lithium ion battery; time X ray diffraction; X ray absorption fine structure

Indexed keywords

BATTERY CHARGING AND DISCHARGING; BEAM LINES; HARD X-RAY PHOTOELECTRON SPECTROSCOPY; IN-SITU ANALYSIS; IT SUPPORTS; LITHIUM-ION BATTERY; TIME RANGE; X RAY ABSORPTION FINE STRUCTURES;

ELECTROCHEMISTRY; PHOTOELECTRONS; X RAY ABSORPTION; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

SECONDARY BATTERIES;

EID: 84891609928     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S1600577513025733     Document Type: Article

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