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Volumn 196, Issue 24, 2011, Pages 10679-10685

Thickness estimation of interface films formed on Li1-xCoO 2 electrodes by hard X-ray photoelectron spectroscopy

(15) Takanashi, Yu a Orikasa, Yuki a Mogi, Masato a Oishi, Masatsugu a Murayama, Haruno a Sato, Kenji a Yamashige, Hisao a Takamatsu, Daiko a Fujimoto, Takahiro a Tanida, Hajime a Arai, Hajime a Ohta, Toshiaki b Matsubara, Eiichiro c Uchimoto, Yoshiharu c Ogumi, Zempachi a

a Center for Advanced Science and Innovation (Japan)

b RITSUMEIKAN UNIVERSITY (Japan)

c KYOTO UNIVERSITY (Japan)

Author keywords

HX PES; Lithium ion batteries; SEI

Indexed keywords

CARBONATE COMPOUNDS; COMPOSITE ELECTRODE; FORMATION MECHANISM; HARD X-RAY PHOTOELECTRON SPECTROSCOPY; HX-PES; INTERFACE FILMS; LITHIUM ION BATTERIES; MAIN COMPONENT; SEI; SOLID ELECTROLYTE INTERFACES; THEORETICAL CALCULATIONS; THICKNESS ESTIMATION;

COBALT COMPOUNDS; ELECTRODES; FILM GROWTH; LITHIUM; LITHIUM COMPOUNDS; PHOTONS; SEEBECK EFFECT; SOLID ELECTROLYTES; THICKNESS MEASUREMENT; X RAY PHOTOELECTRON SPECTROSCOPY;

INTERFACES (MATERIALS);

EID: 80053615719 PISSN: 03787753 EISSN: None Source Type: Journal
DOI: 10.1016/j.jpowsour.2011.08.097 Document Type: Article

Times cited : (26)

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