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Journal of the Electrochemical Society

Volumn 157, Issue 4, 2010, Pages

In situ microtomographic monitoring of discharging processes in alkaline cells

(4) Haibel, A a Manke, I b Melzer, A c Banhart, J b,d

a INSTITUTE OF MATERIALS RESEARCH (Germany)

b HAHN MEITNER INSTITUT (Germany)

c Grillo Werke AG (Germany)

d TECHNISCHE UNIVERSITÄT BERLIN (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALKALINE BATTERIES; ALKALINE CELLS; ANODE MATERIAL; CATHODE MATERIALS; CELL PERFORMANCE; COMPLETE DISSOLUTION; COST STRUCTURE; DEOXIDATION; DISCHARGING PROCESS; DISSOLUTION PROCESS; ELECTROLYTE MATERIAL; EXCELLENT PERFORMANCE; FOCUS OF ATTENTION; HIGH ENERGY; IN-SITU; IN-SITU SYNCHROTRONS; MANGANESE DIOXIDE; NEW YORK; POWER SOURCES; SOLID STATE IONICS; SPATIAL DISTRIBUTION;

ANODES; CATHODES; DISSOLUTION; MANGANESE; MANGANESE COMPOUNDS; PROGRAMMABLE LOGIC CONTROLLERS; SIZE DISTRIBUTION; TOMOGRAPHY; ZINC OXIDE;

ZINC;

EID: 77949682656 PISSN: 00134651 EISSN: None Source Type: Journal
DOI: 10.1149/1.3294566 Document Type: Article

Times cited : (49)

References (16)

1
- 77949736982
- U.S. Department of Justice, National Institute of Justice, Law Enforcement and Corrections Standards and Testing Program, Office of Justice Programs, National Institute of Justice
- U.S. Department of Justice, New Technology Batteries Guide NIJ Guide 200-98, National Institute of Justice, Law Enforcement and Corrections Standards and Testing Program, Office of Justice Programs, National Institute of Justice (1997).
- (1997) New Technology Batteries Guide NIJ Guide 200-98

2
- 0034290997
- 0167-2738, 10.1016/S0167-2738(00)00722-0
- R. M. Dell, Solid State Ionics 0167-2738, 134, 139 (2000). 10.1016/S0167-2738(00)00722-0
- (2000) Solid State Ionics , vol.134 , pp. 139
- Dell, R.M.¹

3
- 0035977354
- 0378-7753, 10.1016/S0378-7753(01)00850-3
- C. C. B. M. de Souza, D. C. de Oliveira, and J. A. S. Tenorio, J. Power Sources 0378-7753, 103, 120 (2001). 10.1016/S0378-7753(01)00850-3
- (2001) J. Power Sources , vol.103 , pp. 120
- De Souza, C.C.B.M.¹ De Oliveira, D.C.² Tenorio, J.A.S.³

4
- 0037503016
- 0013-4651, 10.1149/1.1566014
- Q. C. Horn and Y. Shao-Horn, J. Electrochem. Soc. 0013-4651, 150, A652 (2003). 10.1149/1.1566014
- (2003) J. Electrochem. Soc. , vol.150 , pp. 652
- Horn, Q.C.¹ Shao-Horn, Y.²

5
- 0348117423
- 0378-7753, 10.1016/S0378-7753(98)00108-6
- B. Szczesniak, M. Cyrankowska, and A. Nowacki, J. Power Sources 0378-7753, 75, 130 (1998). 10.1016/S0378-7753(98)00108-6
- (1998) J. Power Sources , vol.75 , pp. 130
- Szczesniak, B.¹ Cyrankowska, M.² Nowacki, A.³

6
- 0003735899
- IEEE, New York
- A. C. Kak and M. Slaney, Principles of Computerized Tomographic Imaging, IEEE, New York (1987).
- (1987) Principles of Computerized Tomographic Imaging
- Kak, A.C.¹ Slaney, M.²

7
- 0003453851
- Academic, New York
- G. T. Herman, Image Reconstruction from Projections: The Fundamentals of Computerized Tomography, Academic, New York (1980).
- (1980) Image Reconstruction from Projections: The Fundamentals of Computerized Tomography
- Herman, G.T.¹

8
- 77949694524
- BESSY Annual Report
- G. Weidemann, J. Goebbels, T. Wolk, and H. Riesemeier, BESSY Annual Report (2001).
- (2001)
- Weidemann, G.¹ Goebbels, J.² Wolk, T.³ Riesemeier, H.⁴

9
- 77949693947
- www.varta.de, last accessed November 2009
- www.varta.de, last accessed November 2009.

10
- 0038879216
- J. Thompson, Editor, Academic, New York
- K. Kordesch and J. Gsellmann, in Power Sources 7, J. Thompson, Editor, Academic, New York (1979).
- (1979) Power Sources 7
- Kordesch, K.¹ Gsellmann, J.²

11
- 0037433648
- 0378-7753, 10.1016/S0378-7753(02)00598-0
- Y. Ein-Eli, M. Auinat, and D. Starosvetsky, J. Power Sources 0378-7753, 114, 330 (2003). 10.1016/S0378-7753(02)00598-0
- (2003) J. Power Sources , vol.114 , pp. 330
- Ein-Eli, Y.¹ Auinat, M.² Starosvetsky, D.³

12
- 77949730693
- Diploma Thesis, Hahn-Meitner-Institut, Berlin, Germany
- S. Kirste, Diploma Thesis, Hahn-Meitner-Institut, Berlin, Germany, (2004).
- (2004)
- Kirste, S.¹

13
- 0003679561
- John Wiley & Sons, New York
- J. Ohser and F. Mücklich, Statistical Analysis of Microstructures in Material Science, John Wiley & Sons, New York (2000).
- (2000) Statistical Analysis of Microstructures in Material Science
- Ohser, J.¹ Mücklich, F.²

14
- 0003733979
- John Wiley & Sons, New York
- G. Lohmann, Volumetric Image Analysis, John Wiley & Sons, New York (1998).
- (1998) Volumetric Image Analysis
- Lohmann, G.¹

15
- 1542364535
- 0378-7753, 10.1016/j.jpowsour.2003.09.006
- U. Köhler, C. Antonius, and P. Bäuerlein, J. Power Sources 0378-7753, 127, 45 (2004). 10.1016/j.jpowsour.2003.09.006
- (2004) J. Power Sources , vol.127 , pp. 45
- Köhler, U.¹ Antonius, C.² Bäuerlein, P.³

16
- 0035368038
- 0378-7753, 10.1016/S0378-7753(01)00496-7
- J. -Y. Huot and M. Malservisi, J. Power Sources 0378-7753, 96, 133 (2001). 10.1016/S0378-7753(01)00496-7
- (2001) J. Power Sources , vol.96 , pp. 133
- Huot, J.-Y.¹ Malservisi, M.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.