Interfacial failure in flexible electronic devices

IEEE Electron Device Letters

Volumn 35, Issue 1, 2014, Pages 132-134

  Chen, Hang ^a   Lu, Bing Wei ^a   Lin, Yuan ^b   Feng, Xue ^a  

^a TSINGHUA UNIVERSITY   (China)

^b UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

failure criteria; Flexible electronics; interfacial failures

Indexed keywords

APPLIED LOADING; FAILURE CRITERIA; FLEXIBLE ELECTRONIC DEVICES; INTERFACIAL FAILURES; SOFT SUBSTRATES;

FAILURE (MECHANICAL); FLEXIBLE ELECTRONICS; FRACTURE MECHANICS; MECHANICAL PROPERTIES;

LOADING;

EID: 84891555464     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2013.2289932     Document Type: Article

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