Slippage toughness measurement of soft interface between stiff thin films and elastomeric substrate

Review of Scientific Instruments

Volumn 82, Issue 10, 2011, Pages

  Huang, Yin ^a   Feng, Xue ^a   Qu, Binrui ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ELASTOMERIC SUBSTRATES; EXPERIMENTAL SETUP; IN-SITU; INTERFACIAL TOUGHNESS; SCANNING ELECTRON MICROSCOPE; SILICON FILMS; SOFT SUBSTRATES; TOUGHNESS MEASUREMENT;

FLEXIBLE ELECTRONICS; SCANNING ELECTRON MICROSCOPY; THIN FILMS;

SUBSTRATES;

EID: 80655143675     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3646461     Document Type: Article

References (22)

1. T. W. Kelley, P. F. Baude, C. Gerlach, D. E. Ender, D. Muyres, M. A. Haase, D. E. Vogel, and S. D. Theiss, Chem. Mater. 16, 4413 (2004). 10.1021/cm049614j
2. X. M. Lu and Y. N. Xia, Nat. Nanotechnol. 1, 163 (2006). 10.1038/nnano.2006.157
3. D. Y. Khang, H. Jiang, Y. Huang, and J. A. Rogers, Science 31, 208 (2006). 10.1126/science.1121401 (Pubitemid 43108182)
4. M. A. Meitl, Z. T. Zhu, V. Kumar, K. J. Lee, X. Feng, Y. Y. Huang, I. Adesida, R. G. Nuzzo, and J. A. Rogers, Nature Mater. 5, 33 (2006). 10.1038/nmat1532 (Pubitemid 43049385)
5. J. A. Rogers and Y. Huang, Proc. Natl. Acad. Sci. U.S.A. 106, 10875 (2009). 10.1073/pnas.0905723106
6. D. H. Kim, J. Xiao, J. Song, Y. Huang, and J. A. Rogers, Adv. Mater. 22, 2108 (2010). 10.1002/adma.200902927
7. A. A. Volinsky, N. R. Moody, and W. W. Gerberich, Acta Mater. 50, 441 (2002). 10.1016/S1359-6454(01)00354-8 (Pubitemid 34064992)
8. A. Bagchi, G. E. Lucas, Z. Suo, and A. G. Evans, J. Mater. Res. 9, 1734 (1994). 10.1557/JMR.1994.1734
9. A. Bagchi and A. Evans, Thin solid films 286, 203 (1996). 10.1016/S0040-6090(96)08551-3
10. A. G. Evans and J. W. Hutchinson, Int. J. Solids Struct. 20, 455 (1984). 10.1016/0020-7683(84)90012-X
11. D. B. Marshall and A. G. Evans, J. Appl. Phys. 56, 2632 (1984). 10.1063/1.333794 (Pubitemid 15420609)
12. L. G. Rosenfeld, J. E. Ritter, T. J. Lardner, and M. R. Lin, J. Appl. Phys. 67, 3291 (1990). 10.1063/1.345363
13. P. G. Charalambides, J. Lund, A. G. Evans, and R. M. McMeeking, J. Appl. Mech. 56, 77 (1989). 10.1115/1.3176069
14. I. Hofinger, M. Oechsner, H. A. Bahr, and M. V. Swain, Int. J. Fract. 92, 213 (1998). 10.1023/A:1007530932726
15. J. Y. Wong, J. B. Leach, and X. Q. Brown, Surf. Sci. 570, 119 (2004). 10.1016/j.susc.2004.06.186
16. R. L. Schnaar, B. G. Langer, and B. K. Brandley, Anal. Biochem. 151, 268 (1985). 10.1016/0003-2697(85)90175-7
17. G. T. Hermanson, Bioconjugate Techniques (Academic, San Diego, CA, 1996).
18. L. C. Dai, X. Feng, B. Liu, and D. N. Fang, Appl. Phys. Lett. 97, 221903 (2010). 10.1063/1.3517488
19. S. I. Park, J. H. Ahn, X. Feng, S. Wang, Y. Huang, and J. A. Rogers, Adv. Funct. Mater. 18, 2673 (2008). 10.1002/adfm.200800306
20. X. Feng, B. D. Yang, Y. Liu, Y. Wang, C. Dagdeviren, Z. Liu, A. Carlson, J. Li, Y. Huang, and J. A. Rogers, ACS Nano 5, 3326 (2011). 10.1021/nn200477q
21. X. Feng, M. A. Meitl, A. M. Bowen, Y. Huang, R. G. Nuzzo, and J. A. Rogers, Langmuir 23, 12555 (2007). 10.1021/la701555n (Pubitemid 350275573)
22. M. A. Meitl, X. Feng, J. Y. Dong, E. Menard, P. Ferreria, Y. Huang, J. A. Rogers, Appl. Phys. Lett. 90, 083110 (2007). 10.1063/1.2679072