메뉴 건너뛰기




Volumn 4, Issue 1, 2014, Pages 48-51

Fully ion implanted and coactivated industrial n-type cells with 20.5% efficiency

Author keywords

Ion implant; n type; screen printed solar cell

Indexed keywords

INDUSTRIAL MANUFACTURING; INDUSTRIAL PRODUCTION; ION IMPLANT; MANUFACTURING FLOW; N-TYPE; REVERSE CURRENTS; SCREEN-PRINTED; SCREEN-PRINTED SOLAR CELLS;

EID: 84891555459     PISSN: 21563381     EISSN: None     Source Type: Journal    
DOI: 10.1109/JPHOTOV.2013.2287760     Document Type: Article
Times cited : (30)

References (10)
  • 1
    • 0001612762 scopus 로고    scopus 로고
    • Electronic properties of light-induced recombination centers in boron-doped Czochralski silicon
    • J. Schmidt and A. Cuevas, "Electronic properties of light-induced recombination centers in boron-doped Czochralski silicon," J. Appl. Phys., vol. 86, pp. 3175-3180, 1999. (Pubitemid 129648249)
    • (1999) Journal of Applied Physics , vol.86 , Issue.6 , pp. 3175-3180
    • Schmidt, J.1    Cuevas, A.2
  • 6
    • 84891559444 scopus 로고    scopus 로고
    • Ion implantation for n-type solar cells
    • presented at the Amsterdam, The Netherlands, May
    • N. Bateman, "Ion implantation for n-type solar cells," presented at the nPV-Workshop 2012, Amsterdam, The Netherlands, May 14-15, 2012.
    • (2012) NPV-Workshop 2012 , pp. 14-15
    • Bateman, N.1
  • 8
    • 84869462416 scopus 로고    scopus 로고
    • Ionimplant doped large-area n-type Czochralski high-efficiency industrial solar cells
    • Jun.
    • M. Sheoran, M. Emsley, Y. Min, D. Ramappa, and P. Sullivan, "Ionimplant doped large-area n-type Czochralski high-efficiency industrial solar cells," in Proc. 38th IEEE Photovoltaic Spec. Conf., Jun. 3-8, 2012, pp. 2254-2257.
    • (2012) Proc. 38th IEEE Photovoltaic Spec. Conf. , vol.3-8 , pp. 2254-2257
    • Sheoran, M.1    Emsley, M.2    Min, Y.3    Ramappa, D.4    Sullivan, P.5
  • 9
    • 80052095463 scopus 로고    scopus 로고
    • In-depth analysis of transient errors of inline IV measurements
    • T. Roth, D. Wichmann, K. Meyer, and M. Orlob, "In-depth analysis of transient errors of inline IV measurements," Energy Procedia, vol. 8, pp. 82-87, 2011.
    • (2011) Energy Procedia , vol.8 , pp. 82-87
    • Roth, T.1    Wichmann, D.2    Meyer, K.3    Orlob, M.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.