Stochastic analysis on RAID reliability for solid-state drives

Proceedings of the IEEE Symposium on Reliable Distributed Systems

Volumn , Issue , 2013, Pages 71-80

  Li, Yongkun ^a,b   Lee, Patrick P C ^b   Lui, John C S ^b  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

^b CHINESE UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

CTMC; RAID; Reliability; Solid state Drives; Transient Analysis

Indexed keywords

CONTINUOUS TIME MARKOV CHAIN; CTMC; RAID; RELIABILITY GUARANTEE; RELIABILITY REQUIREMENTS; SOLID-STATE DRIVES; TRACE DRIVEN SIMULATION; TRANSIENT RELIABILITY;

BIT ERROR RATE; COMPUTER SIMULATION; REDUNDANCY; RELIABILITY; TRANSIENT ANALYSIS;

RELIABILITY ANALYSIS;

EID: 84891541508     PISSN: 10609857     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SRDS.2013.16     Document Type: Conference Paper

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