Simple Technique for Source Reflection Coefficient Measurement while Characterizing Active Devices

53rd ARFTG Conference Digest Spring 1999: Automatic RF Techniques Group: Nonlinearity Characterization, ARFTG Spring 1999

Volumn , Issue , 1999, Pages

  Ferrero, Andrea ^a   Madonna, Gian Luigi ^a  

^a POLITECNICO DI TORINO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

MICROWAVE MEASUREMENT; SYSTEMATIC ERRORS;

ACTIVE DEVICES; BIAS CONDITIONS; CALIBRATION PROCEDURE; MICROWAVE ACTIVE DEVICES; REFERENCE PLANE; REFLECTION COEFFICIENT MEASUREMENT; SMALL SIGNAL IMPEDANCES; TRADITIONAL TECHNIQUES;

REFLECTION;

EID: 84890691068     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG.1999.327341     Document Type: Conference Paper

References (8)

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2. F. M. Ghannouchi and R. Bosisio, "Source-pull/load-pull oscillator measurements at microwave/mm wave frequencies, " IEEE Trans. Microwave Theory Tech., vol. MTT-41, pp. 32-35, Feb. 1992.
3. D. L. Le and F. M. Ghannouchi, "Multitone characterization and design of FET resistive mixers based on combined active sourcepull/ load-pull techniques, " IEEE Trans. Microwave Theory Tech., vol. MTT-46, pp. 1201-1208, Sep. 1998.
4. C. Tsironis, "A novel design method of wideband power amplifier, " Microwave J., pp. 303-304, May 1992.
5. G. P. Bava, U. Pisani and V. Pozzolo, "'Source pull' technique at microwave frequencies, " Electronic Lett., vol. 20, n. 4, pp. 152-154, Feb. 1984.
6. B. Hughes and P. Tasker, "Improvements to on-wafer noise parameter measurements, " in 36th ARFTG Conf. Dig., Monterrey, CA, Nov. 29-30, 1990, pp. 16-25.
7. G. Berghoff, E. Bergeault, B. Huyart and L. Jallet, "Automated characterization of HF power transistor by source-pull and multiharmonic load-pull measurements based on six-port techniques, " IEEE Trans. Microwave Theory Tech., vol. MTT-46, pp. 2068-2073, Dec. 1998.
8. G. L. Madonna, M. Pirola, A. Ferrero and U. Pisani, "Testing microwave devices under different source impedances: a novel technique for on-line measurement of source and device reflection coefficients, " in IEEE IMTC/99 Conf. Proc., Venezia, Italy, May 24-26, 1999.