Testing microwave devices under different source impedances: A novel technique for on-line measurement of source and device reflection coefficients

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 1, Issue , 1999, Pages 130-133

  Madonna, G L ^a   Pirola, M ^a   Ferrero, A ^a   Pisani, U ^a  

^a POLITECNICO DI TORINO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC NETWORK ANALYZERS; ELECTROMAGNETIC WAVE REFLECTION; MICROWAVE DEVICES; REFLECTOMETERS; VECTORS;

DEVICE UNDER TESTS (DUT);

MICROWAVE MEASUREMENT;

EID: 0032679623     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (10)