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Volumn , Issue , 2013, Pages

High-field transport in graphene and carbon nanotubes

Author keywords

ballistic transport; carbon nanotubes; graphene; high field transport; nonequilibrium statistics

Indexed keywords

APPLIED VOLTAGES; BALLISTIC TRANSPORTS; DRIFT VELOCITIES; HIGH ELECTRIC FIELDS; HIGH FIELD TRANSPORT; NONEQUILIBRIUM STATISTICS; SEMICONDUCTING MATERIALS; VELOCITY VECTORS;

EID: 84890482930     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EDSSC.2013.6628176     Document Type: Conference Paper
Times cited : (1)

References (5)
  • 1
    • 78751492247 scopus 로고    scopus 로고
    • Transition of equilibrium stochastic to unidirectional velocity vectors in a nanowire subjected to a towering electric field
    • v. K. Arora. D. C. Y. Chek. M. L. P. Tan. and A. M. Hashim. "Transition of equilibrium stochastic to unidirectional velocity vectors in a nanowire subjected to a towering electric field." Journal of Applied Physics, vol. 108. pp. 114314-8. 2010
    • (2010) Journal of Applied Physics , vol.108 , pp. 114314-114318
    • Arora, V.K.1    Chek, D.C.Y.2    Tan, M.L.P.3    Hashim, A.M.4
  • 2
    • 34247882648 scopus 로고    scopus 로고
    • Scaling of resistance and electron mean free path of single-walled carbon nanotubes
    • May 4
    • M. S. Purewal, B. H. Hong, A. Ravi, B. Chandra, J. Hone, and P. Kim, "Scaling of resistance and electron mean free path of single-walled carbon nanotubes," Physical Review Letters, vol. 98, p. 186808, May 4 2007.
    • (2007) Physical Review Letters , vol.98 , pp. 186808
    • Purewal, M.S.1    Hong, B.H.2    Ravi, A.3    Chandra, B.4    Hone, J.5    Kim, P.6
  • 3
    • 17944383013 scopus 로고    scopus 로고
    • High-field electrical transport in single-wall carbon nanotubes
    • Z. Yao, C. L. Kane, and C. Dekker, "High-Field Electrical Transport in Single-Wall Carbon Nanotubes," Physical Review Letters, vol. 84, pp. 2941-2944,2000.
    • (2000) Physical Review Letters , vol.84 , pp. 2941-2944
    • Yao, Z.1    Kane, C.L.2    Dekker, C.3
  • 4
    • 77957321479 scopus 로고    scopus 로고
    • Resistance blow-up effect in micro-circuit engineering
    • Dec
    • M. L. P. Tan, T. Saxena, and V. Arora, "Resistance blow-up effect in micro-circuit engineering," Solid-State Electronics, vol. 54, pp. 1617-1624. Dec 2010.
    • (2010) Solid-State Electronics , vol.54 , pp. 1617-1624
    • Tan, M.L.P.1    Saxena, T.2    Arora, V.3
  • 5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.